Install the latest FIB/SEM thin slice sample preparation instrument for covalent measurement

2021-11-16 21:15:32 By : Mr. Min Duan

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Silicon Valley Labs has expanded its electron microscope capabilities with industry-leading S/TEM thin section sample preparation on the newly installed Thermo Scientific Helios 5 UX DualBeam instrument.

Sunnyvale, California, November 15, 2021 /PRNewswire/ - Covalent Metrology, a leading analytical services provider in North America, announced the installation of a new Thermo Scientific Helios 5 UX DualBeam focused ion beam scanning electron microscope. The instrument is now available for customer projects and is one of the only tools of this type provided by an analysis service provider in the United States.

Through installation, Covalent now provides ultra-precision focused ion beam (FIB) capabilities, including enhanced (scanning) transmission electron microscope (S/TEM) sheet preparation. Covalent customers in the semiconductor, nanotechnology, quantum computing, and microelectronics industries will benefit from the groundbreaking FIB resolution at low FIB acceleration energy, allowing the preparation of samples with amorphous damage layers less than 1 nm.

Covalent customers get the most insights from S/TEM images generated from optimally prepared S/TEM samples. In order for experts to visualize elemental and structural information with atomic resolution, samples must be prepared for accurate imaging. The advanced ion beam optics integrated in Helios 5 UX facilitates efficient and accurate milling and nanomanipulation. Combined with the auto-alignment and improved resolution on Helios 5 UX, it is now possible to manipulate and prepare samples for S/TEM characterization or other FIB-SEM applications with unparalleled accuracy and reduced damage layers.

"Covalent's transmission electron microscopy team is pleased to use the new Helios 5 UX instrument to provide our customers with more vivid TEM and S/TEM analysis," said Jason Donald, director of transmission electron microscopy at Covalent Metrology. "Helios 5 UX is the top-of-the-line DualBeam that can be used for this important work, and it allows us to reliably and efficiently generate the high-quality thin slices needed to provide our customers with the best TEM results."

The automation and processing software of Helios 5 UX maximizes the consistency and speed of Covalent S/TEM sample preparation. With these additional features, Covalent experts can now create multiple S/TEM slices with unparalleled repeatability and quality to meet customers' single-point imaging needs, more advanced multi-point arrays for structured S/TEM analysis, As well as repetitive or routine analysis items.

Learn more about the TEM, S/TEM, and FIB-SEM features of covalent measurement.

About Covalent Metrology Covalent Metrology is a disruptive analytical services laboratory and platform located in Sunnyvale, California. Its mission is to help companies using advanced materials obtain better data and insights more easily and economically to facilitate faster development and production. Covalent has dramatically changed the characterization and imaging fields by combining transparent pricing, data platforms, and first-class customer service with world-class scientists, state-of-the-art tools, and strategic partnerships.

Covalent now has more than 500 customers in more than 30 industries.

Learn more: https://covalentmetrology.com

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